How can I test bus-structured digital electronics to ensure that the units will function in the final system?
The M9-Series VXI digital test instruments accurately emulate complex digital signals, including digital buses. The M9-Series ensure reliable high-fault-coverage functional tests. Features include up to 256 timing sets with 4-drive phases and 4-test windows that are fully programmable, selectable per pin, and switchable on-the-fly. Flexible timing features make it easy to map simulation results, bus specifications, or Unit Under Test (UUT) requirements to M9-Series test patterns. Absolute accuracy is specified across all pins using a proven, time-domain reflectometry technique that actively measures and removes channel-to-channel delay. Dual-threshold voltage detection guarantees that the UUT meets voltage-level specifications, ensuring that the tested unit can adequately drive the other devices in the system.
