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Is it possible to obtain parametric data mapped to specific sites on the wafers from a given MOSIS run?

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Is it possible to obtain parametric data mapped to specific sites on the wafers from a given MOSIS run?

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Vendors do not generally provide this information. In special cases MOSIS may release to approved customers wafer-mapped data for selected parameters from the MOSIS standard nine-sites-per-wafer database.

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