Important Notice: Our web hosting provider recently started charging us for additional visits, which was unexpected. In response, we're seeking donations. Depending on the situation, we may explore different monetization options for our Community and Expert Contributors. It's crucial to provide more returns for their expertise and offer more Expert Validated Answers or AI Validated Answers. Learn more about our hosting issue here.

Why are atomic force microscope (AFM) standards needed?

0
Posted

Why are atomic force microscope (AFM) standards needed?

0

Atomic force microscopes (AFM’s) are being increasingly used as metrology tools in a variety of industrial applications, thus driving an increasing demand for accuracy in these instruments. Some properties commonly measured in the industrial setting are feature spacing (pitch), feature height (or depth), feature width (critical dimension), and surface roughness. To achieve high accuracy in AFM measurements, the scales of an instrument should be calibrated. The use of a calibration standard is normally the most straightforward and appropriate means of doing this.

Thanksgiving questions

*Sadly, we had to bring back ads too. Hopefully more targeted.