Can most components be measured in-circuit?
Some measurements are hard to make in-circuit, but MDAs provide methods that allow very high test coverage. Some of these methods are: Low-amplitude ranges that prevent diode turn-on. Complex-impedance measurements that can individually discriminate among capacitive, inductive and resistive components of parallel networks. Choice of measurement frequencies to optimize impedance of measured components compared to parallel components. Use of multipoint guarding to eliminate or reduce the effect of parallel impedances.
Related Questions
- How long does the AEPS Test take to complete? Can the AEPS Test be given in isolation, or can components be measured during the instructional day?
- With harmonic measurement, the measured values of the fundamental wave components and bar graphs of the harmonics are not displayed. Why not?
- Does MagicTest cover the same range of components as in-circuit test values?
