How is scanning electron microscopy (SEM) used for failure analysis?

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How is scanning electron microscopy (SEM) used for failure analysis?

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This technique uses the scattering of electrons to observe small surface features not easily detected with conventional optical microscopy. The excellent depth of field (compared to light microscopes) gives great 3-dimensional resolution of surfaces at very high magnifications. Resolution range is in the 50-100 Angstrom range.

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