Why use x-ray microdiffraction?
– Materials properties such as strength and fatigue resistance are highly dependent on microstructure. X-ray microdiffraction can measure local variations in stress, orientation, and plastic deformation between grains and within individual grains, helping us understand mechanical properties at this critical length scale. – In microelectronics and related industries, the dimensions of the constitutive devices range from a few microns to submicron. Confinement and interfaces make thin film mechanical properties drastically different than bulk materials. With x-ray microdiffraction, we can measure local characteristics such as texture and stress within individual devices, offering an experimental counterpart to computer simulations. – Samples such as soils are highly complex and are a challenge for spatially resolved characterization. X-ray microdiffraction allows for structural identification of small amounts of phases imbedded in a heterogeneous matrix.
